Materials scientists at Rice University have developed a new workflow methodology for measuring microscopic defects in ...

A study published in Molecules and led by researchers from the Changchun Institute of Optics, Fine Mechanics and Physics (CIOMP) of the Chinese Academy of Sciences demonstrated how deep learning can ...

A new study explores deep learning for image-based defect detection during 3D printing, looking to catch bad builds.

The newly released line scan 3D AXI delivers up to a 20% performance improvement compared to the award-winning TR7600 SIII ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

This new technical paper titled “End-to-end deep learning framework for printed circuit board manufacturing defect classification” is from researchers at École de technologie supérieure (ÉTS) in ...

Ford tackles record recalls by pairing veteran engineers with defect-detection AI, driving a big JD Power quality jump.

Spread the love“`html In any product-driven industry, dealing with product defects is a given. No matter how stringent the quality checks or how dedicated the design team, issues can arise during ...

Atomic defects can tune carbon quantum dots across UV to near-infrared light, guiding cleaner design of sensors, bioimaging ...